Contamination Troubleshooting for Microelectronics Packaging

نویسندگان

چکیده

Abstract A goal of advanced packaging design performance is to reduce power and achieve better control heat electromagnetic interference. Materials efficient include the use gold (Au) wire, copper (Cu) alloy, gold/silver (Au/Ag) plating, solder, low-k epoxy dry-film polymers, silicones polyimides. Material purity verification contamination during production process a prerequisite ensure high yields in because getting this wrong means throwing away multiple chips. This paper describes an Analytical Decision Tree guide methodology selection, reviews troubleshooting methodologies, case studies resolve issues.

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ژورنال

عنوان ژورنال: Proceedings of the ... International Symposium on Microelectronics

سال: 2021

ISSN: ['1085-8024']

DOI: https://doi.org/10.4071/1085-8024-2021.1.000286